The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2001
Filed:
Aug. 16, 1999
Ralph Pringle, Jr., Albuquerque, NM (US);
Felix E. Morgan, Albuquerque, NM (US);
The B. F. Goodrich Company, Charlotte, NC (US);
Abstract
A method and apparatus for measuring the frequency of a desired resonant mode of a crystal arrangement, or other two-port device, during an automated operation. The crystal arrangement, or other two-port device, is placed into a test circuit and subjected to a sinusoidal test signal of known frequency. Based upon the output response of the crystal arrangement to the test signal, the frequency of the test signal is changed such that the test signal rapidly converges on a desired mode of operation of the crystal arrangement. This is accomplished by first noting a desired increase in amplitude of the output response of the crystal arrangement, followed by measuring an error signal related to the desired crystal arrangement mode of operation. When the error equals a predetermined value the frequency of the sinusoidal test signal is the frequency of the desired mode.