The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2001
Filed:
Jun. 16, 1999
Fumio Kobayashi, Omiya, JP;
Shinichi Matsuda, Omiya, JP;
Fuji Photo Optical Co., Ltd., Saitama, JP;
Abstract
In a moire apparatus having a projection grating,, three-dimensional data of an object to be measured,is computed from the moire fringe observed while the projection grating,is moved, a distance-measuring reference point P (X, Y, Z) on the object,is selected from the three-dimensional data, and the distance L between the distance-measuring reference point P (X, Y, Z) and a taking lens,is measured. The distance L can automatically be measured by detecting the peak of video output signal of a CCD camera,while moving its lens,L along the optical axis. Also, the distance-measuring reference point P (X, Y, Z) may be displayed with a flag on a monitor,for observing the moire fringe, and the distance between the object,and the taking lens,may be measured with reference to the flag-displayed pixel. A stationary grating,having a pitch identical to that of the projection grating,is disposed near the projection grating,, so as to form a moire fringe. From the change in this moire fringe generated when the projection grating,is moved, the amount of movement of the projection grating,is computed. The change in moire fringe is detected when a photocell,placed near the stationary grating,detects the illuminance of the moire fringe.