The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2001

Filed:

Jul. 23, 1999
Applicant:
Inventors:

Jorge L. Acosta, Eugene, OR (US);

Robert W. Rudeen, Eugene, OR (US);

Assignee:

PSC Scanning, Inc., Eugene, OR (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 7/10 ;
U.S. Cl.
CPC ...
G06K 7/10 ;
Abstract

A method of and a system for generating a dense pattern of scan lines. In a preferred configuration, multiple laser beams are formed and directed along offset outgoing paths onto a scanning mechanism such as a polygon mirror which scans the beams across pattern mirrors to generate simultaneous scan patterns out into the scan volume. Return light from both scan patterns are retrodirectively collected and redirected by a common collection element such as a collection lens. The collection lens focuses return light from the first beam onto a first detector and light from the second beam onto a second detector, the first and second detectors being offset in corresponding fashion to the offset of the outgoing beams.


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