The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 18, 2001

Filed:

Jan. 10, 2000
Applicant:
Inventors:

Joachim Baumann, München, DE;

Andre Berghs, Neunkirchen, DE;

Martin Beyfuss, München, DE;

Felix Türk, München, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01L 1/02 ;
U.S. Cl.
CPC ...
G01L 1/02 ;
Abstract

A method for measuring the tensile stress distribution over the width of the metal strip is provided. In order to measure the tensile stress in a metal strip between two roll stands or between a roll stand and a coiler or a guide roll, a force is exerted on the metal strip using a suction device and effecting a deflection of the metal strip. The deflection of the metal strip is measured and used for calculating the tensile stress distribution over the width of the metal strip.


Find Patent Forward Citations

Baumann, Joachim. (2001). Device for measuring tensile stress distribution in a metal strip (U.S. Patent No. 6289750). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6289750

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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