The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Feb. 20, 1999
Takashi Kitagaki, Tokyo, JP;
Agilent Technologies, Inc., Loveland, CO (US);
Abstract
A data processing apparatus for an IC tester that generates data or evaluates data, includes a first memory; a first reconfigurable logic device operative during input and output of data, for converting signals for internal use in the data processing apparatus, an internal configuration of the first reconfigurable logic device being alterable to accomplish such converting; a second reconfigurable logic device for receiving data from the first memory or the first reconfigurable logic device and for processing the data in accordance with an internally configured combination of elements, an internal configuration of the second reconfigurable logic device being alterable to accomplish details of the processing; a third reconfigurable logic device for establishing a specific interface when data is transmitted and received between the second reconfigurable logic device and the first memory, an internal configuration of the third reconfigurable logic device being alterable in accordance with a selected type of interface; and a device coupled to each of the first, second and third reconfigurable logic devices for inputting an internal configuration to each thereof.