The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Jan. 29, 1999
Applicant:
Inventors:

Chin-Kai Meng, Hockessin, DE (US);

Roger Firor, Landenberg, PA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/100 ; G06F 1/900 ;
U.S. Cl.
CPC ...
G01N 3/100 ; G06F 1/900 ;
Abstract

Disclosed is a method of identifying an anomalous sample in a group of complex samples. The method provides vapor phase molecules from each complex sample to a mass sensor to derive a mass spectrum representative of each of the complex samples. Further, the method provides all of the mass spectra to a computer in a data matrix. The method performs exploratory data analysis on the data matrix using at least one set of principal components and performs a classification analysis of such matrix using a soft independent modeling of class analogy technique to select masses exhibiting high discrimination power. The method performs a mass correlation analysis with the selected masses to determine at least three correlated masses. A comparison of the three correlated masses is made to a library of mass spectra to identify at least one candidate that is potentially indicative of the anomalous sample. A review is made of the one or more candidates to identified the anomalous sample.


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