The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Dec. 17, 1999
Rudolph M. Snoeren, Eindhoven, NL;
Petrus W. J. Linders, Eindhoven, NL;
Christianus G. L. M. Nederpelt, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus includes an X-ray source (,) for emitting an X-ray beam, an X-ray detector (,) for detecting an X-ray image and converting it into an optical image, and a video extractor (,) which is coupled to the X-ray detector (,) via optical coupling means (,). The optical coupling means (,) is provided with an optical pick up (,) for feeding a fraction of the light flux to a photosensor (,) which produces a control signal for adjusting the X-ray flux from the X-ray source (,). The photosensor (,) is provided with an array of pixels, with weighting means for the signals detected in or by each of said pixels, and with means for determining a mean value of the detected and weighted signals, yielding a control signal which is fed back in order to adjust the X-ray flux from the X-ray source (,).
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile