The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Sep. 01, 1999
Applicant:
Inventors:

Yoshinori Arai, Tokyo, JP;

Masakazu Suzuki, Kyoto, JP;

Akifumi Tachibana, Kyoto, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

An X-ray computed tomography (CT) method of producing sectional images and panoramic images while reducing the exposure dose and time. The method includes producing an X-ray projection image on a two-demensional X-ray image sensor by turning a rotary arm within a scope of angle according to the projection conditions, while locally radiating conical X-ray beams, with a small width in the rotating direction of the beams, with the rotating center of the rotary arm fixed at the center position of the region to be X-rayed and the X-ray projection images are processed using specific equation as previously prepared by a computer to extract image information, and thereby to produce a sectional image of the local region of the object to be examined.


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