The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Jun. 02, 1997
Applicant:
Inventors:

William Widener, Louisville, CO (US);

Timothy C. Hughes, Boulder, CO (US);

Assignee:

Exabyte Corporation, Boulder, CO (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/584 ; G11B 1/561 ;
U.S. Cl.
CPC ...
G11B 5/584 ; G11B 1/561 ;
Abstract

In a method of calibrating a helical scan magnetic tape drive, a dual scan calibration tape having a calibration stripe is loaded into the tape drive. As a head traverses differing paths along the calibration stripe, a series of calibration signal waveforms is obtained. For each calibration signal waveform in the series, a voltage measurement is made at a predetermined position within each waveform. A maximum one of the voltage measurements is used to generate a measured overlap scale factor (MOV) indicative of an overlap of the read head relative to the calibration stripe. As a subsequent calibration stripe on the calibration tape is read in a dual scan calibration mode, the measured overlap scale factor is utilized to generate a track position error vector. The track position error vector is used to adjust a tape path guide of the tape drive.


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