The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Sep. 27, 2000
Applicant:
Inventors:

Hiroyuki Deguchi, Tokyo, JP;

Norio Miyahara, Tokyo, JP;

Shuji Urasaki, Tokyo, JP;

Soichi Matsumoto, Tokyo, JP;

Masato Ishiguro, Yamanashi, JP;

Tomohiro Mizuno, Tokyo, JP;

Shigeru Makino, Tokyo, JP;

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01Q 3/00 ;
U.S. Cl.
CPC ...
H01Q 3/00 ;
Abstract

An antenna mirror surface measuring/adjusting apparatus has a plane mirror larger than an aperture surface of said principal reflection mirror and set in parallel with the aperture surface, an actuator for driving a group of mirror surface panels of the principal reflection mirror, and a receiving electric field arithmetic processor for measuring, each time the actuator shifts a position of the mirror surface panel from an initial state of the mirror surface panel of the principal reflection mirror, radio wave signals of radio waves radiated by a transmitter/receiver and reflected back from the plane mirror, obtaining an aperture surface phase distribution in an initial state of the principal reflection mirror by executing an arithmetic process on these measured signals, then gaining configurations of the mirror surface on the basis of the aperture surface phase distribution, and adjusting the mirror surface by the actuator in accordance with the obtained mirror surface configurations. Accordingly, a measurement frequency is freely selected, and the measurement can be carried out in an ideal measurement environment of not being influenced by changes in wind, sunlight and temperature, whereby the mirror surface can be adjusted with high accuracy.


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