The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Mar. 19, 1999
Applicant:
Inventors:
Assignee:
U.S. Philips Corporation, New York, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01V 3/00 ; A61B 5/055 ;
U.S. Cl.
CPC ...
G01V 3/00 ; A61B 5/055 ;
Abstract
The invention relates to an imaging method for medical examinations, notably MR examinations, in which a set of measurement values is acquired from measuring points which are irregularly distributed in the frequency domain (or in the k-space). Before an image in the space domain is generated from these measurement values by a Fourier transformation, the measurement values must be weighted in dependence on the density of the measuring points in the frequency domain. To this end, the measurement values are weighted in conformity with the magnitude of the Voronoi cells.