The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Oct. 07, 1999
Applicant:
Inventors:

Koji Tsuru, Iruma, JP;

Koushi Murata, Tokorozawa, JP;

Naobumi Suzuki, Mitaka, JP;

Hideki Nakajima, Kodaira, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 3/100 ; G01R 3/1308 ;
U.S. Cl.
CPC ...
G01R 3/100 ; G01R 3/1308 ;
Abstract

A method and apparatus for measuring the resonance frequency of an electric circuit with low disturbance and high accuracy is disclosed. An electrooptic crystal, whose refractive index changes according to the strength of an applied electric field, is used as a sensor, and a frequency-sweep electromagnetic wave is applied to a resonance section of an electric circuit from an external device. The induced current flowing in the resonance section generates an electric field, which is detected by measuring the refractive index of the electrooptic crystal in the form of the relevant light intensity. The resonance frequency is determined based on the maximum electric field strength.


Find Patent Forward Citations

Tsuru, Koji. (2001). Apparatus and method for measuring resonance frequency of electric circuit (U.S. Patent No. 6288530). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6288530

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…