The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 11, 2001
Filed:
Jan. 19, 1999
Applicant:
Inventors:
Nicholas L. Abbott, Madison, WI (US);
Justin J. Skaife, Lafayette, CA (US);
Assignee:
The Regents of the University of California, Oakland, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J 3/700 ;
U.S. Cl.
CPC ...
H01J 3/700 ;
Abstract
Scanning probe microscopy is used to quantitatively characterize structural anisotropy within obliquely deposited metal films. Whereas visual inspection of AFM images (real space or reciprocal space) reveals no obvious structural anisotropy within these gold films, by quantitative analysis of the AFM profiles, subtle structural anisotropy is observed. The quantitative characterization provides a method to estimate the influence of anisotropy on the orientations of supported mesogenic layers.