The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 11, 2001

Filed:

Sep. 17, 1999
Applicant:
Inventors:

Steven Aoyama, Marion, MA (US);

William Gobush, N. Dartmouth, MA (US);

Diane I. Pelletier, Fairhaven, MA (US);

Charles A. Days, S. Dartmouth, MA (US);

George Costa, Somerville, MA (US);

Assignee:

Acushnet Company, Fairhaven, MA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A63B 5/300 ; G01M 1/00 ;
U.S. Cl.
CPC ...
A63B 5/300 ; G01M 1/00 ;
Abstract

A method and a system for measuring the spin decay rate of a golf ball. The system includes an indoor testing area, a launching device, and a measuring device positioned at a final position along the ball's flight path. When the ball is launched by the launching device, the measuring device measures the spin rate and speed at the final position. Then, the launching device can launch the ball at the speed and spin rate of the final position and a new final speed and spin rate are measured again. The spin rate difference from launching to the final position is used to determine the spin decay rate. By using discrete spin decay rate measurements, the spin decay rate profile of a golf ball during its entire flight can be measured in the indoor area.


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