The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2001

Filed:

Apr. 21, 1999
Applicant:
Inventors:

Samuel Neely Hopper, Longmont, CO (US);

Christopher Starbuck Kush, Longmont, CO (US);

John Charles Wilson, Longmont, CO (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/100 ; G06F 7/02 ;
U.S. Cl.
CPC ...
G06F 1/100 ; G06F 7/02 ;
Abstract

An method and apparatus for error checking. A known test pattern is written into a predetermined byte of a scan line. The method may include generating a known test pattern in a byte of a scan line and transmitting the scan line data through a first data path. The scan line data at the end of the first data path may be evaluated to determine if the test pattern is still in the predetermined byte of the scan line. If the pattern in the predetermined byte is correct, the test pattern may be removed from the predetermined byte and the scan line data may be transmitted to a print engine. If the pattern in the predetermined byte is incorrect, then a signal may be sent to terminate the transmission of the scan line data.


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