The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Aug. 20, 1999
Dale R. Greer, Novi, MI (US);
Perceptron, Inc., Plymouth, MI (US);
Abstract
The photogrammetric measurement system is positioned at a vantage point to detect and calibrate its reference frame to the external reference frame demarcated by light-reflecting retroreflective target dot on a spherical target. A tetrahedron framework with the spherical target mounted on one of the vertices serves as a reference target that is placed in front of the non-contact sensor to be calibrated. The photogrammetric measurement system reads and calibrates the position of the retroreflective target dot (and thus the tetrahedron) while the structured light of the sensor is projected onto the framework of the reference target. The structured light intersects with and reflects from the reference target, providing the non-contact sensor with positional and orientation data. This data is correlated to map the coordinate system of the non-contact sensor to the coordinate system of the external reference frame.