The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Aug. 25, 1998
Sholom M. Ackelsberg, Brookfield, WI (US);
Gary R. Strong, Waukesha, WI (US);
Holly A. McDaniel, New Berlin, WI (US);
Carlos F. Guerra, Lake Mills, WI (US);
Hui Hu, Waukesha, WI (US);
Hui David He, Waukesha, WI (US);
Robert Senzig, Germantown, WI (US);
General Electric Company, Schenectady, NY (US);
Abstract
The present invention, in one form, is a system which, in one embodiment, adjusts the x-ray source current to reduce image noise to better accommodate different scanning parameters. Specifically, in one embodiment, the x-ray source current is adjusted as a function of image slice thickness, scan rotation time, collimation mode, table speed, scan mode, and filtration mode. Particularly, a function is stored in a CT system computer to determine an x-ray source current adjustment factor so that the appropriate x-ray source current is supplied to the x-ray source for the determined parameters. After adjusting the x-ray source current, an object is scanned.