The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2001

Filed:

Oct. 13, 1999
Applicant:
Inventors:

John F. Seely, Fairfax, VA (US);

Craig N. Boyer, Mitchellville, MD (US);

Glenn E. Holland, Wheaton, MD (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05G 1/64 ;
U.S. Cl.
CPC ...
H05G 1/64 ;
Abstract

A dual-energy x-ray system is provided which is useful in densitometry and other applications. A dual energy x-ray source, formed field emission x-ray tube driven by a Marx generator, produces a single x-ray pulse of a very short duration (e.g., 10 to 200 nanoseconds). The pulse provides x-ray energy of a first, high value early in the pulse and x-ray energy of a second, lower value later in the pulse so as to provide a dual energy level x-ray distribution comprising hard and soft x-rays. A detector system having dual x-ray energy discrimination properties, formed by soft and hard x-ray detectors and an inter-detector, receives the x-ray pulse and discriminates between the dual x-ray energy levels of the pulse.


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