The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Nov. 16, 1999
Applicant:
Inventor:
Mahmoud Farhadiroushan, London, GB;
Assignee:
Sensornet Limited, Ely, GB;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01B 9/02 ;
U.S. Cl.
CPC ...
G01B 9/02 ;
Abstract
A system for measuring the strain in a structure in which the temperature at the location the strain is measured is also measured in which an optic fiber is incorporated in the structure which has an interferometer positioned at the point or points where the strain is to be measured. A pulse of light is sent down the fiber and the backscattered light is split to separate the Raman Scattered Spectrum light. The interferometer is used to measure the strain and the Raman Scattered Spectrum light is used to measure temperature and loss.