The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Feb. 04, 1999
Elyahu Perl, Manlius, NY (US);
Sensis Corporation, Dewitt, NY (US);
Abstract
An apparatus and method for testing of rotating surface based antennas arrays (regardless of their shape), with the capability of fully diagnosing and locating a failure on the face of the antenna by coherently sampling and storing the radiation in the near field and imaging the fully array complex excitation from the stored data. The rotation of the antenna is used in order to collect data for the full azimuth span required for high resolution imaging of excitation in the horizontal domain. Excitation in the vertical domain can be preformed in two ways depending on the type of antenna used. For electronically scanning antennas in elevation (phased array antennas), the phase shifter in the desired row is toggled and the row is isolated by subtracting the complex data from pairs of adjacent samples. The sampling probe is moved vertically while the antenna is rotating horizontally. The vertical movement of the probe provides the aperture necessary to resolve the vertical excitation of the array to a degree of accuracy sufficient for fault detection and isolation.