The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Jul. 31, 1998
Marc S. Walker, Taylorsville, UT (US);
Philips Electronics North America Corporation, New York, NY (US);
Abstract
A jitter unit converts a stable input test signal into a jittering output test signal used to test the jitter tolerance of electronic equipment. This jitter device allows any test or sample signal (analog or digital, video or audio) to be used for testing such equipment. Jitter is a type of timing error between the expected or ideal timing of a signal and the actual timing of a signal in which the characteristics of the timing error change with time. The characteristics of jitter include the level of error, the frequency of change in the error and whether the change is periodic or random. The jitter unit uses a variable delay unit to delay the signal and uses a controller to regulate the delay of the delay unit in order to transform the stable signal into a jittering signal.