The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
Dec. 23, 1999
Applicant:
Inventor:
Masaru Sanada, Tokyo, JP;
Assignee:
NEC Corporation, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 2/358 ;
U.S. Cl.
CPC ...
H01L 2/358 ;
Abstract
An internal-logic inspection circuit in an LSI includes a MOSFET having a first diffused region connected to an internal node of an internal circuit, a second diffused region connected to a diode and a gate connected to a pad. The diode is irradiated with a laser beam while the gate of MOSFET is applied with a gate voltage, and a resultant current is measured for judging the level of the internal node. The diode can be disposed in a space where overlying interconnects are not disposed.