The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2001

Filed:

Nov. 04, 1998
Applicant:
Inventors:

James L. Hanna, Ann Arbor, MI (US);

Donald R. Smith, Ann Arbor, MI (US);

Assignee:

Other;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/186 ;
U.S. Cl.
CPC ...
G01N 2/186 ;
Abstract

An inspection system for evaluating rotationally asymmetric workpieces for conformance to configuration criteria having a track for causing the workpieces to translate through a test section, the test section including a plurality of electromagnetic energy sources, the plurality of electromagnetic energy sources oriented with respect to the track means such that the workpieces occlude the plurality of electromagnetic energy sources upon passing through the test section, the test section further having electromagnetic energy detectors for receiving the electromagnetic energy to provide output signals related to the intensity of the occluded electromagnetic energy incident on the electromagnetic energy detectors, and a signal processing means for receiving said output signals.


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