The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 04, 2001
Filed:
May. 21, 1999
Igor Chernushevich, Etobicoke, CA;
Bruce Thomson, North York, CA;
MDS Inc., Etobicoke, CA;
Abstract
There is provided a method of effecting mass analysis on an ion stream, the method comprising passing the ion stream through a first mass resolving spectrometer, to select parent ions having a first desired mass-to-charge ratio. The parent ions are then subject to collision-induced dissociation (CID) to generate fragment ions, and the fragment ions and any remaining parent ions are trapped; the CID and trapping can be carried out together in a linear ion trap. Periodically pulses of the trapped ions are released into a time of flight (TOF) instrument to determine the mass-to-charge ratio of the ions. The delay between the release of the pulses and the initiation of the push-pull pulses of the TOF instrument are adjusted to maximize the duty cycle efficiency and hence the sensitivity for a selected ions with a desired mass-to-charge ratio. This technique can be used to optimize the performance for a parent ion scan, and MRM scan or a neutral loss scan.