The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 04, 2001

Filed:

Jul. 31, 2000
Applicant:
Inventors:

Kazuhiro Yoshimura, Toyohashi, JP;

Yasuhisa Murakami, Toyohashi, JP;

Assignee:

Nidek Co., Ltd., Aichi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 3/10 ;
U.S. Cl.
CPC ...
A61B 3/10 ;
Abstract

A slit-lamp biomicroscope which illuminates an eye to be examined with slit illumination light, the biomicroscope comprises an illumination optical system provided with an illumination light source and a slit plate of which slit width is adjustable, a plurality of types of filters each having a different optical characteristic which are inserted into, and removed from an optical path of the illumination optical system, a filter detection device for detecting a type of the filter being inserted in the optical path of the illumination optical system, a light amount change device for changing an amount of illumination light on a side of the illumination light source with respect to the slit plate and a control device for controlling the light amount change device such that the amount of illumination light is adjusted to an amount corresponding to the detected filter based on a detection result obtained by the filter detection device.


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