The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Oct. 20, 1998
Applicant:
Inventor:

Nicolas C. Assouad, Niwot, CO (US);

Assignee:

Adaptec, Inc., Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B 5/09 ; G11B 1/902 ;
U.S. Cl.
CPC ...
G11B 5/09 ; G11B 1/902 ;
Abstract

The invention includes a method and integrated circuit for testing a disk drive. The invention internally generates test inputs to the host interface in the disk drive. The test inputs emulate the actual inputs that a host computer would provide to the host interface. One version of the invention includes a drive control integrated circuit. The drive control integrated circuit comprises: a host interface, a processor, a buffer control, and compare circuitry. The processor processes test instructions to initiate a test pointer. The buffer control transfers commands from a buffer to the host interface in response to the pointer. The processor controls a write operation and a read operation in response to the commands. The compare circuitry compares the data block that is written to the address with another data block that is read from the address. The compare circuitry generates an alarm if the data blocks do not match.


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