The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Dec. 14, 1998
Applicant:
Inventors:
Yongchun Lee, Rochester, NY (US);
Peter Rudak, Hilton, NY (US);
Daniel T. Jaramillo, Rochester, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/36 ;
U.S. Cl.
CPC ...
G06K 9/36 ;
Abstract
A digital image processing method and system is adapted to remove diagonally disposed artifacts such as lines, dots, dashes etc., from a scanned skew corrected document or image. The system and method converts a captured skew corrected image into first and second binary images and generates a map indicative of a difference between the first and second binary images. Black pixels in the map are projected based on a skew angle of the image to form a projection profile, and an image based on the map, detected peaks in the projection profile and the pixels is created.