The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Aug. 31, 1995
Applicant:
Inventor:

Kenneth G. Leib, Wantagh, NY (US);

Assignee:

Northrop Grumman Corporation, Los Angeles, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/40 ;
U.S. Cl.
CPC ...
G06K 9/40 ;
Abstract

A system is presented for reconstructing blurred text on a word-by-word basis. The text is scanned and compared with a priori data concerning characteristics of the text, including zone characteristics of each letter of the alphabet. Comparisons are made between the line spacing of an image undergoing test and standard spacing. Such tests can also determine whether the image undergoing test was recorded while maintaining a tilted position. The blurred text is reconstructed on a word-by-word basis and may be displayed on a monitor. If the image undergoing test was photographed at an excessive focal length, the system is capable of detecting this and aborting analysis.


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