The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Feb. 27, 1998
Fujitsu Limited, Kawasaki, JP;
Abstract
A processing apparatus for measuring accumulated values of performance monitoring (PM) parameters concerning a reception signal received by a transmission device, which is capable of detecting upper layer failures in a more accurate, hardware-based way, without increasing the workload imposed on the system's firmware. PM parameters represent the statistics of events that meet prescribed criteria for defects and anomalies in the reception signal. The processing apparatus has a plurality of failure detection units to detect different kinds of failures in the reception signal and produce failure detection signals corresponding thereto. Those failure detection units include a first failure detection unit that detects a first kind of failure and a second failure detection unit that detects a second kind of failure. On the basis of the failure detection signals, a PM controller detects at least one kind of PM parameter, and a counter unit accumulates the detected PM parameter. A control signal generator produces a stop command signal that is activated while at least the second kind of failure is present. This stop command signal is supplied to the first failure detection unit to inhibit its operation and stop the detection of the first kind of failure.