The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Oct. 19, 2000
Applicant:
Inventor:

Katsumi Ogino, Kamakura, JP;

Assignee:

Nikon Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G02B 2/106 ;
U.S. Cl.
CPC ...
G02B 2/106 ;
Abstract

A laser microscope or a confocal laser scanning microscope is provided with a microscope main body mounted on an anti-vibration table and a laser light source for supplying a laser light to this microscope main body. The laser light source comprises a laser radiation source for radiating a laser light of a predetermined wavelength and a laser cavity for converting the wavelength of a laser light from the radiation source. The radiation source and the laser cavity are separated from each other, and are connected to each other by means of optical fiber. The laser cavity is incorporated into the microscope main body.


Find Patent Forward Citations

Ogino, Katsumi. (2001). Laser microscope and confocal laser scanning microscope (U.S. Patent No. 6282020). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6282020

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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