The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Sep. 08, 2000
Fritz Schreyer Allen, Corrales, NM (US);
Jun Zhao, Albuquerque, NM (US);
New Chromex, Inc., Freeway, NM (US);
Abstract
A method for producing a standard Raman spectrum of a sample. A source of incident radiation is provided. Means provide an incident beam and a monitor beam from the incident radiation. The incident beam is directed to the sample and a Raman beam is generated from the sample. Spectral data may be collected directly from the monitor beam and the Raman beam simultaneously. The occurrence of a frequency shift in the incident radiation is determined. One spectral measurement is made after the occurrence of the frequency shift, or a first spectral measurement is made before and a second spectral measurement is made after the frequency shift. One or more arithmetic calculations are applied to the single spectral measurement, or the second spectral measurement is subtracted from the first spectral measurement. One or more integral transforms are applied to the resulting spectral measurement data to produce the standard Raman spectrum.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile