The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Jun. 23, 1999
Norio Masuda, Tokyo, JP;
Naoya Tamaki, Tokyo, JP;
NEC Corporation, Tokyo, JP;
Abstract
A semiconductor device evaluation apparatus is provided with a test board. A print wiring is provided at a first surface of the test board on which a semiconductor device is mounted. A terminal of the semiconductor device is connected to the print wiring. A power circuit is provided at a second surface opposite to the first surface of the test board. The power circuit is connected to the print wiring and actuates the semiconductor device. The apparatus is also provided with a magnetic field detector arranged above the print wiring and detects a magnetic field generated from the print wiring. Further, the apparatus is provided with a current detector detecting a value of current carried through the print wiring based on the magnitude of the magnetic field detected by the magnetic field detector.