The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Jun. 13, 1996
Applicant:
Inventors:

Hirokazu Sugihara, Katano, JP;

Makoto Taketani, Kyoto, JP;

Akihito Kamei, Nara, JP;

Hiroshi Iwasaki, Hirakata, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 2/700 ;
U.S. Cl.
CPC ...
G01N 2/700 ;
Abstract

A two-dimensional sensor includes a photoconductive layer whose conductivity increases at a light-irradiated spot, an insulating layer formed on the front surface of the photoconductive layer, an effect electrode formed on the back surface of the photoconductive layer, and a fence as a cell holder attached to the surface of the insulating layer for containing a cell, culture medium and a reference electrode. The sensor is placed in an incubator and a bias voltage is applied between the effect and reference electrodes. When a laser beam irradiates a spot of the back surface of the sensor, a signal is obtained from the effect electrode. This signal corresponds to a potential alteration due to the cell activity substantially at the laser-irradiated spot. The signal is processed in a computer. The beam spot size and location, corresponding to the size and the location of the measurement electrode, can be changed or adjusted easily by focusing or moving the laser beam.


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