The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Jun. 04, 1999
Kabushiki Kaisha Toshiba, Kawasaki, JP;
Abstract
A diagnostic apparatus for nuclear medicine capable of performing an operation of counting gamma rays for a TCT simultaneously with an operation of counting gamma rays for an SPECT has a SPECT counter for counting, as the number of photons, gamma rays passed through a SPECT energy window centered at a photoelectric peak of the SPECT gamma rays and a TCT counter for counting, as the number of photons, gamma rays passed through a TCT energy window centered at a photoelectric peak of the TCT gamma rays. The number of photons of the gamma rays passed through the SPECT energy window contains the number of photons of K-X rays generated due to a photoelectric effect produced by the TCT gamma rays in collimators of the detector. A K-X ray processor estimates the number of photons of mixed K-X rays on the basis of the number of photons counted at the TCT counter. The K-X ray correction processor performs K-X ray correction on the photon number counted at the SPECT counter on the basis of the photon number of the estimated K-X rays. Since the number of photons passed through the TCT energy window and number of photons of K-X rays passed through the SPECT energy window have a very strong correlation from the standpoint of probability statistics, the accuracy with which the number of photons of the K-X rays passed through the SPECT energy window is estimated is very high. It is, therefore, possible to effectively reduce the K-X rays passed through the SPECT energy window.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile