The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Apr. 05, 1999
Applicant:
Inventors:
Pavel Lazarev, Belmont, CA (US);
Mikhail Paukshto, San Mateo, CA (US);
Assignee:
Quanta Vision, Inc., San Mateo, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 2/320 ;
U.S. Cl.
CPC ...
G01N 2/320 ;
Abstract
A method for characterizing a test sample of biological tissue is disclosed. The method includes obtaining a radiation scattering pattern produced by the test sample of biological tissue and processing the radiation scattering pattern to determine a pair distance distribution function for the test sample. The method also includes comparing sample data derived from the pair distance distribution function with known data derived from known samples which each have one or more known characteristics.