The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Apr. 28, 1999
Tomoyuki Kobayashi, Hachioji, JP;
Kouji Kobayashi, Hachioji, JP;
Kouichi Sato, Hachioji, JP;
Takeo Yamada, Yokohama, JP;
Nireco Corporation, Tokyo, JP;
Abstract
An object to be measured is analyzed by a chemical means or a physical means to make its characteristic value clear, a spectrum of the same object to be measured is obtained by an off-line near infrared spectral analyzer, a calibration indicative of a relation between the spectrum and the characteristic value is obtained, at least one sample is selected from among the same kind of objects to be measured, spectra are obtained by the off-line near infrared spectral analyzer and an on-line near infrared spectral analyzer, a difference between both of the obtained spectra is obtained, a spectrum of the same kind of object to be measured is measured by the on-line near infrared spectral analyzer, the measured spectrum is corrected by the difference between both of the spectra, and the characteristic value of the object to be measured is estimated by using the corrected spectrum and the calibration.