The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Apr. 14, 1999
Applicant:
Inventors:
Steven A. Bogen, Sharon, MA (US);
Gail E. Radcliffe, Worcester, MA (US);
Assignee:
Cytologix Corporation, Cambridge, MA (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 3/3543 ; G01N 3/3553 ; G01N 3/3569 ;
U.S. Cl.
CPC ...
G01N 3/3543 ; G01N 3/3553 ; G01N 3/3569 ;
Abstract
The invention describes quality control devices for assays that measure analytes in cells and tissue samples, and methods of use thereof. In particular, the quality control device comprises a matrix affixed with synthetic controls in different concentrations, or different synthetic controls. The quality control device can be adhered to a microscope slide and processed simultaneously with a tissue sample.
Bogen, Steven. (2001). Quality control for cytochemical assays (U.S. Patent No. 6281004). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6281004
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile