The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Apr. 14, 2000
Maurice Whelan, Angera, IT;
Alfredo C. Lucia, Osmate, IT;
European Atomic Energy Community (EUROTOM), Luxembourg, LU;
Abstract
A device for measuring the deformation of a mechanical test specimen, and including a pressing member (,) for stressing a substantially flat specimen (,) in controlled manner by means of a punch (,); a Michelson interferometer having an optical branch (,) defined optically by a first face (,) of the specimen (,), and for generating interference images related to the deformation of the specimen (,); a telecamera (,) for acquiring and digitizing the interference images; and a processor (,) for processing the digitized images and controlling the measuring process fully automatically. The interferometer (,) may alternatively perform white light interferometry measurements, ESPI measurements, or ESPI profilometry measurements, by simply substituting the light source and control software.