The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2001
Filed:
Mar. 26, 1999
Masaharu Tsujii, Zama, JP;
Fumihiko Koshimizu, Zama, JP;
Akashi Corporation, Kanagawa-ken, JP;
Abstract
A method for calibrating an apparatus for calibrating a hardness tester, the method comprising the steps of: setting a plurality of calibration points between a rated force point at which a rated force of a force measuring member is applied and a zero point at which no-load is applied, for measuring outputs (mV/V) from the force measuring member according to test forces(N) applied to the force measuring member; and calculating a relation between the test forces(N) and the outputs(mV/V) as an approximation based on the test forces(N) and the outputs(mV/V) according to the test forces(N) at the calibration points. An apparatus for evaluating a dynamic characteristic of a specimen, which installed in a hardness tester, the apparatus comprising: a force measuring member; a force transmitting portion which is movable up and down; a distance measuring member incorporated in the force transmitting portion to be contacted with the force measuring member from above; and an indenter.