The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 28, 2001

Filed:

Jul. 06, 1999
Applicant:
Inventor:

Shen-Jen Chen, Taipei, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 3/50 ; G01B 3/36 ;
U.S. Cl.
CPC ...
G01B 3/50 ; G01B 3/36 ;
Abstract

The present invention relates to a thickness gauge which comprises a plurality of metallic sheets made to have standard thickness, a U-shaped frame and a screw which adjusts tightness of the metallic sheets. The present invention is characterized in that each metallic sheet comprises a hole and that the hole positions of any two neighboring metallic sheets are different; when two or more pieces of metallic sheets overlap, the holes of the metallic sheets will be shielded by other metallic sheet and human eyes can not see through the holes. In another preferred embodiment, the thickness gauge is characterized in that there is a cut at each metallic sheet. Whereby users can distinguish clearly and conveniently one metallic sheet from several metallic sheets overlapping together and could avoid misuse and measurement errors.


Find Patent Forward Citations

Chen, Shen-Jen. (2001). Thickness gauge (U.S. Patent No. 6279241). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6279241

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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