The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2001

Filed:

Oct. 02, 1998
Applicant:
Inventors:

Michael Alexander Bowen, Poughkeepsie, NY (US);

Moises Cases, Austin, TX (US);

Howard Harold Smith, Beacon, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/750 ;
U.S. Cl.
CPC ...
G06F 1/750 ;
Abstract

A method of on-chip interconnect design in an integrated circuit (IC) is provided. Fast circuit simulations of each net constituting the IC are performed for noise margin and slew rate analysis. A resistor/capacitor (RC) network for each net is generated from net lengths, and assignments of parasitic cross-coupling capacitances and shunt capacitances derived from three-dimensional field solver evaluations of pre-routing phase estimated wire geometries. If the noise margin and slew rate criteria are not satisfied for the net under simulation, the simulations are iterated, with a new wire geometry selected between iterations, until the criteria are satisfied. Each net is tagged with a wire geometry that satisfies noise margin and slew rate requirements which can then be passed to a routing tool.


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