The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2001

Filed:

Oct. 30, 1998
Applicant:
Inventors:

Vishal Malik, Sunnyvale, CA (US);

Alejandro Quiroz, San Jose, CA (US);

Martin J. Whittaker, Cupertino, CA (US);

James M. Hull, Cupertino, CA (US);

Michael R. Morrell, Mountain View, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 1/126 ; G06F 1/128 ;
U.S. Cl.
CPC ...
G06F 1/126 ; G06F 1/128 ;
Abstract

A method verifies that a processor is executing instructions in a proper endian mode when the endian mode is changed dynamically. In accordance with the present invention, a test suite written and compiled in big endian mode is loaded into memory. The test suite is converted to little endian mode and stored back to memory. Next, the processor status is changed from big endian mode to little endian mode, and the test suite is executed. Finally, the results of the test suite are examined to ensure that the processor properly executed the instructions in little endian mode.


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