The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2001

Filed:

Feb. 05, 1999
Applicant:
Inventors:

Rakesh Agrawal, San Jose, CA (US);

Roberto Javier Bayardo, San Jose, CA (US);

Dimitrios Gunopulos, Riverside, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
U.S. Cl.
CPC ...
G06F 1/730 ; G06F 7/00 ;
Abstract

A dense data-set mining system and method is provided that directly exploits all user-specified constraints including minimum support, minimum confidence, and a new constraint, known as minimum gap, which prunes any rule having conditions that do not contribute to its predictive accuracy. The method maintains efficiency even at low supports on data that is dense in the sense that many items appear with high frequency (e.g. relational data).


Find Patent Forward Citations

Agrawal, Rakesh. (2001). System and method for constraint-based rule mining in large, dense data-sets (U.S. Patent No. 6278997). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6278997

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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