The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2001
Filed:
Dec. 01, 1997
Douglas J. Franchville, Indianapolis, IN (US);
Andrew E. Bowyer, Indianapolis, IN (US);
Wavetek Corporation, Indianapolis, IN (US);
Abstract
An exemplary embodiment of the present invention is an apparatus for receiving sweep testing signals and generating frequency response values therefrom. The apparatus includes a test input, a controller, a receiver circuit and a measurement circuit. The test input has a first connection arrangement for connecting to a test output of the sweep transmitter and also has a second connection arrangement for connecting to a terminal of the communication system to be tested. The controller is operable to generate a sweep control signal responsive to a sweep plan. The receiver circuit has a control input connected to receive the sweep control signal from the controller, and is operable to tune to a plurality of frequencies responsive to the sweep control signal. The measurement circuit is coupled to the receiver circuit and is operable to generate measurement signals corresponding to the plurality of frequencies. In accordance with the present invention, the controller is further operable to: receive a first set of measurement signals from the measurement circuit when said test input is connected in the first connection arrangement; receive a second set of measurement signals from the measurement circuit when said test input is connected in the second connection arrangement; and generate a frequency response based on the first set of measurement signals and the second set of measurement signals.