The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 21, 2001

Filed:

Feb. 11, 2000
Applicant:
Inventor:

Stanley E. Jaffe, Santa Rosa, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 1/320 ; G06F 1/531 ;
U.S. Cl.
CPC ...
G01R 1/320 ; G06F 1/531 ;
Abstract

A scale control method provides fine scale control in a measurement instrument and also provides scale control spanning wide adjustment ranges. The method detects the presence of the user input to a control sensor and establishes an acceleration factor for the input based on a rate at which events are generated by the control sensor. The acceleration factor modifies a defined scale step size that has a correspondence to the events generated by the control sensor. The defined scale step size, as modified by the acceleration factor, is added to a prior scale to establish a present scale. The present scale and prior scale are used to select a detent value from a series of detent values and to determine if a detent is applicable. When a detent is applicable, the present scale is set to the selected detent value and control of the scale parameters is then determined by this detent value. When the detent is not applicable scale parameters are adjusted according to the defined step size as modified by the acceleration factor.


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