The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2001
Filed:
Aug. 27, 1999
Martin Annis, Cambridge, MA (US);
Richard J. Adler, Albuquerque, NM (US);
Robert J. Richter-Sand, Albuquerque, NM (US);
Other;
Abstract
Transmission and scatter detectors for an x-ray inspection system preferably employing a moving pencil beam comprise a solid plastic scintillating material having a front planar surface that is impinged by incident x-ray energy. The detectors also include light detectors that are cooperatively mounted to the plastic scintillating material to detect photons within the plastic scintillating material created in response to x-rays incident on the front planar surface. The detector may be a transmission detector or a scatter detector. The detectors of the present invention are relatively thin in comparison to prior art detectors, which allows shielding to be reduced. In addition, the detectors of the present invention have a greater efficiency of detection in comparison to the prior art detectors.