The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2001
Filed:
Aug. 02, 1999
Applicant:
Inventor:
Michael Markelov, Chesterland, OH (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 1/22 ;
U.S. Cl.
CPC ...
G01N 1/22 ;
Abstract
A system for analysis of materials includes a sensor loop (,). The sensor loop includes sensors (,) therein. The sensor loop includes traps (,). Sample material is desorbed from a first trap, moved past the sensors and collected in the second trap. The material is then desorbed from the second trap, moved past the sensors and again collected in the first trap. The amount and rate of flow of the sample material past the sensors is controlled, and the repeated exposure of the sensors to the sample material enhances sensitivity.