The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 21, 2001
Filed:
Dec. 16, 1998
Applicant:
Inventors:
Victor Pichai Chu, Hockessin, DE (US);
Connie Mary Sanders, Newark, DE (US);
James Floyd Pierson-Perry, Elkton, MD (US);
Tie Quan Wei, Bear, DE (US);
Assignee:
Dade Behring Inc., Deerfield, IL (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 3/353 ;
U.S. Cl.
CPC ...
G01N 3/353 ;
Abstract
Calibration of an assay by converting an analyzer's normal signal response through an arithmetic function prior to performing the curve fit, thereby improving the accuracy of the curve fit in a region of greatest diagnostic interest.
Chu, Victor. (2001). Method for calibrating a chemical analyzer with improved accuracy at low signal levels (U.S. Patent No. 6277584). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6277584
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile