The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 14, 2001

Filed:

Oct. 08, 1999
Applicant:
Inventors:

Vipin Kewal Ramani, Niskayuna, NY (US);

Rasiklal Punjalal Shah, Latham, NY (US);

Peter Michael Edic, Albany, NY (US);

Shankar Visvanathan Guru, Clifton Park, NY (US);

Abdalmajeid Musa Alyassin, Niskayuna, NY (US);

Randal Vincent Dusing, Mukwonago, WI (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B 6/03 ;
U.S. Cl.
CPC ...
A61B 6/03 ;
Abstract

A system is provided for identifying faults in a non-OEM computed tomography system having components in connection with the detectors to reconstruct an image. Then, correlation values are derived from baseline reference data files and current data files collected after a fault is suspected in the CT system. The correlation values are compared against a threshold to identify suspect detectors and a pattern recognition algorithm is applied to determine if the suspect detectors are faulty or if one of the components processing the output signals has failed. If baseline files are unavailable, the identification of faulty components is accomplished by performing correlation between the current data files and average profile values.


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