The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 14, 2001
Filed:
Nov. 03, 1998
Xiaofen Chen, West Linn, OR (US);
Linley F. Gumm, Beaverton, OR (US);
Thomas L. Kuntz, Portland, OR (US);
Textronic, Inc., Beaverton, OR (US);
Abstract
A system for in-service nonlinearity measurements measures such nonlinearities by way of comparing received linear error-corrected unfiltered signal samples with re-generated reference signal samples to calculate magnitude and phase nonlinear error values. Linear distortion is removed from the received signal samples in order to truly characterize nonlinear behavior of the transmitter. The linear error-corrected received signal samples are generated without applying the receiver shaping filtering. Reference signal samples are re-generated from estimated transmitted symbols from the unfiltered linear error-corrected received signal samples. The transmitted symbols are estimated using a multi-region slicer which dynamically estimates constellation decision levels from the unfiltered signal samples. A weighted, least-square based polynomial regression is performed on magnitude and phase nonlinear error values to estimate magnitude and phase nonlinear error functions while suppressing the impact of other non-systematic distortions.